Beijing (Gasgoo)- Recently, CATARC and OMNIVISION jointly established the CATARC-Omnivision Automotive IC Joint Laboratory in Tianjin Economic-Technological Development Area (TEDA).
Photo credit: OMNIVISION
Located within the Microelectronics Innovation Park, the lab will focus on automotive chip testing systems, including interoperability testing, electromagnetic compatibility validation, ATE automated testing, and reliability and safety verification.
Leveraging both parties' strengths in chip testing infrastructure, technology, expert teams, and resources, the joint lab aims to build capabilities in automotive chip safety, compatibility, and consistency. Through collaborative research and innovation, the lab seeks to enhance both companies' market competitiveness domestically and internationally in the automotive-grade chip sector, promoting advancements in intelligent connected vehicle chip testing and application.
The launch of this joint lab marks a significant step in CATARC and OMNIVISION’s collaborative research efforts in automotive-grade chips. Looking ahead, TEDA aims to deepen enterprise cooperation, expand application channels, and accelerate the development of the automotive chip industry ecosystem, contributing to the area's high-quality growth.
